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Of all the emerging drying technologies to mitigate pattern collapse, sublimation drying is particularly promising due to its simple process conditions and low cost of ownership. In this work, we developed a single wafer sublimation drying process using a custom-formulated sublimation chemical. Process optimization is mainly achieved by fine-tuning the film thickness through wafer rotation and optimizing the chemical concentrations. The optimized sublimation drying process demonstrated damage-free results on ultra-HAR fin structures, significantly outperforming conventional drying techniques such as IPA, hot IPA, and SMT drying.
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Tanaka et al. (2026) studied this question.
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