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We study directional port compatibility, finite bridge reliability and graph-theoretic fault tolerance in the interior chrysene lattice. In the fixed-port model, the disubstituted family D=\6,12\ supports only the y-axis, while the admitted trisubstituted and tetrasubstituted families produce exact bridge--family counts. On a 3×3 layer, the fixed-port and orientation-admissible family sums are 4,410,944 and 10,648,000, compared with the corrected scalar-degree sum 60,454,593. Under independent lateral-edge installation on a compatible scaffold with intact vertical contacts, retention of at least one complete site in each prescribed daughter half has probability [1-(1-pb⁴)ʰ⁻²]². Within the 3×3×2h box family, the $95%$ retention thresholds are $90$, $108$ and $162$ nodes at pb=0.95, $0.90$ and $0.80$; the stated containment model gives corresponding length parameters $239$, $243$ and $259$ bp, with $233$ bp at saturation. An edge lies on an elementary plaquette exactly when its endpoints admit a three-edge bypass. This yields a unit-metric distortion bound and preserves connectivity after deletion. Plaquette completeness directly excludes the seven- and fourteen-vertex crosses but has a sharp $19$-vertex local minimum; the $27$-vertex box requires an additional corner-closure hypothesis. We give the cycle ranks, boundary-map ranks, Laplacian gaps and single- and double-edge resilience of the two benchmark boxes, separating graph connectivity from mechanical stability and chemical repair. Reproducible verification and finite Lean certificates accompany the conditional molecular interpretation.
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Charles D. Schaper (2026) studied this question.
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