Registration of ‘ND‐WGE‐23F2254’: A durum wheat breeding line with tan spot resistance adapted to the Northern Great Plains

Durum wheat ( Triticum turgidum L. ssp. durum (Desf.) Husn.) is an important food crop. In the United States, durum wheat is mainly cultivated in the Northern Great Plains, particularly in North Dakota and Montana. Tan spot (caused by Pyrenophora tritici‐repentis ) is a foliar fungal disease that affects wheat production worldwide. The pathogen infects wheat leaves, reducing the photosynthetic area and resulting in yield losses. Developing resistant cultivars is the most environmentally sustainable and ecologically responsible strategy for minimizing yield losses caused by this disease. We report the registration of ‘ND‐WGE‐23F2254’ (Reg. No. GP‐1102, PI 709603), a durum wheat line adapted to the Northern Great Plains with resistance to tan spot. ND‐WGE‐23F2254 was developed by introgressing the resistant allele of a race‐nonspecific tan spot resistance quantitative trait locus (QTL; TS‐3B‐QTLrn ) from the Australian breeding line PI 192640 into the local durum wheat cultivar ‘ND Grano’ using marker‐assisted backcross selection. ND‐WGE‐23F2254 was evaluated for its reactions to multiple races of P. tritici‐repentis in the greenhouse and showed significantly lower disease severity than the cultivar ND Grano. Field evaluation at two locations in North Dakota showed that the introgression of the QTL from the donor into ND Grano did not result in significant changes in grain yield, days to heading, or plant height, but slightly lower grain protein content compared with that of the recipient parent was observed at one of the two locations grown in 2025.