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An analysis of the applicability of the ABC recombination model to describing the current dependence of the internal quantum efficiency (IQE) demonstrates its inadequacy. The main criticisms are as follows: – The use of a secondary parameter for quantum-well device structures, namely the excess carrier concentration, as the argument in the current dependence of IQE, especially under the assumption of equal electron and hole concentrations in the space-charge region; – Auger recombination and radiative recombination are partial components of a unified inter-band recombination process and therefore cannot be treated as independent processes; – The ABC model unjustifiably ignores the fundamental mechanism of tunneling current formation; – In the ABC model, the origin of the nonradiative current is attributed to the Shockley – Read – Hall recombination mechanism, whereas in the device structure it is governed by the Sah – Noyce – Shockley mechanism. Based on this critical analysis, it is concluded that an adequate model describing the IQE – current dependence should be developed on the basis of the physical mechanisms governing the fundamental currents in quantum-well device structures: – The recombination current via defect levels in quantum wells, Jt; – The inter-band recombination current, JB; – The tunnelling current, JT. Such a model should also account for the unified mechanism responsible for the formation of the radiative component of inter-band recombination, (1‑p)・JB, and the nonradiative component, p・Jb, where p is the partition coefficient dependent on JB. A general expression for the current dependence of IQE is proposed as follows: ηIQE=(1‑p)・ JB /(Jt+JB+JT).
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Manyakhin et al. (2026) studied this question.
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