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May 1, 1985Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy

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KTK. TakayanagiYTY. TanishiroMTMasaetsu Takahashi

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Cite This Study

Takayanagi et al. (1985) studied this question.

synapsesocial.com/papers/6a1820f33aabde875b1356fehttps://doi.org/10.1116/1.573160
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