BTI Aging Influence Analysis and Mitigation in Flash ADCs

Bias Temperature Instability (BTI)-induced aging of transistors is a serious concern in modern electronic circuits, yet its effects on the operation of mixed-signal circuits have not been extensively studied. In this work, initially we analyze how BTI-induced aging degradation influences the analog front end of Flash analog-to-digital converters (ADCs). BTI-induced aging leads to substantial increments in the offset voltage of the ADC comparators, which in turn affect their trip point voltage, leading to the alteration of the ADC’s performance characteristics, such as gain, full-scale error and integral nonlinearity. Thus, erroneous responses are generated. Next, we propose a low-cost BTI-induced aging mitigation technique based on a circuit reconfiguration method which periodically alters the average voltage stress on the ADC comparators’ transistors. The proposed method limits the comparators’ offset voltage development, restricting the shift in their trip point voltage. Consequently, the impact of aging on the performance characteristics of the ADC is drastically reduced, and its reliability is improved. According to our simulations, after two years of operation, the gain error is reduced by 95.43%, the full-scale error is reduced by 63.31% and the integral nonlinearity is reduced by 63.00%, with respect to operation without applying the proposed aging mitigation technique.