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September 10, 2025Journal of Instrumentation

Review of sub-electron noise CMOS image sensors

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Authors

PWPrayag WakaleBDB. DierickxFTFilip Tavernier

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Overview

Review explores low-noise solutions in CMOS image sensors for single-photon detection, indicating advancements in active pixel technology.

Key Points

  • Achieving noise levels below 0.3 e - RMS is crucial for effective single-photon detection in imaging applications.
  • Active pixel sensors separate sensing and conversion, leading to better noise cancellation and performance improvements.
  • Continuous enhancements have allowed CMOS image sensors to replace CCDs, providing comparable performance with lower noise levels.
  • Techniques like correlated double sampling play a key role in reducing noise and improving image sensor capabilities.

Cite This Study

Wakale et al. (2025) studied this question.

synapsesocial.com/papers/68c1b61454b1d3bfb60eb637https://doi.org/10.1088/1748-0221/20/08/c08003
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