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Analysis demonstrates accurate coupling coefficient between dielectric resonator and microstrip line, highlighting method usefulness.
The dielectric resonators (DR's) are increasingly used in many microwave systems using resonators, filters etc. These DR applications are especially useful where the system requirements demand high Q value, compact size, low loss and high temperature stability characteristics. In the present paper, a practical DR structure enclosed by a metallic shielding is considered for analysis. The versatile finite element finite difference method has been used to obtain the field distribution in the shielded structure. Further, the field components so obtained are used to evaluate the coupling coefficient between the DR and the associated microstrip line. The results are plotted and compared with the experimental values which show excellent agreement. This method can be extended to analyze the case of a generalized DR assembly with spacer inbetween the DR and the substrate.
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Tonmoy Bhattacharjee (1991) studied this question.
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