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Analysis reveals current-voltage hysteresis in memristive thin films, implying advantages of thermodynamic insights.
Various methods have been proposed for the computational study of memristive thin films, including classical continuum, molecular dynamics, and first-principles. More recently, the phase field method has been investigated and validated. We examine our previous phase field method from its variational basis and give a thermodynamic interpretation of current-voltage hysteresis and spontaneous conducting filament formation starting from initial conditions that accurately reflect as-fabricated films. Because our phase field method does not require direct local density of states computation, it provides improved computational efficiency and scalability, enabling practical waferscale mapping, uniformity, and endurance analysis and optimization.
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John F. Sevic (2025) studied this question.
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