This review discusses measurement methods and simulation techniques for thin liquid film corrosion, highlighting non-contact optical technology and finite element methods.
Thin liquid film corrosion is a critical failure mechanism for the atmospheric environment and industrial infrastructure. This review systematically examines relevant methods and recent advances in characterizing and simulating this phenomenon. Various measurement methods for liquid film thickness, composition, and conductivity are investigated, with particular focus on the advantages of non-contact optical technology and X-ray fluorescence (XRF) in in situ monitoring and analysis. For corrosion simulation, the finite element method (FEM), cellular automaton (CA), and molecular dynamics (MD) are widely used. Their combination has synergistic potential in revealing essential corrosion mechanisms and establishing prediction models across scales.
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Cai et al. (2025) studied this question.
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