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September 30, 2025Journal of Bioengineering, Technologies and HealthOpen Access

Development of a Side-View System for Atomic Force Microscopy (AFM)

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Authors

VCVitor Lucena Fabianski CamposVPValmara Silveira PonteMMMarilena Meira

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Overview

This study demonstrates enhanced resolution in atomic force microscopy with a novel optical system.

Key Points

  • The optical system achieved improved imaging performance, allowing better precision in sample analysis.
  • Results from six tests showed a comprehensive evaluation of the field of view and resolution for AFM.
  • High-resolution imaging was assessed with a specific exposure time of 3,000 milliseconds for accurate results.
  • Qualitative tests confirmed the system's feasibility for effective side imaging in atomic force microscopy.

Cite This Study

Campos et al. (2025) studied this question.

synapsesocial.com/papers/68dc1e3b8a7d58c25ebb1abehttps://doi.org/10.34178/jbth.v8i3.503
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