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September 17, 2024Journal of Physics D Applied PhysicsOpen Access

Optical and electrical studies on the TS defect in 4H-SiC

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Authors

JLJohannes A. F. LehmeyerFriedrich-Alexander-Universität Erlangen-NürnbergAFAlain H. FuchsUniversité Paris-SudZLZhengming LiFriedrich-Alexander-Universität Erlangen-Nürnberg

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Lehmeyer et al. (2024) studied this question.

synapsesocial.com/papers/68e58333b6db643587520746https://doi.org/10.1088/1361-6463/ad7bc5
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