Measurement and Modeling of SDC Memristors: Extensive Study

This study systematically addresses the challenge of accurately modeling memristors, focusing on four distinct types doped with tungsten, tin, chromium, and carbon, fabricated by Known Inc. A comprehensive characterization was performed by subjecting the devices to sinusoidal excitations with varying frequencies and amplitudes, followed by data averaging and high-frequency filtering. The resulting measurements were fitted using three prominent memristor models: VTEAM, MMS, and Yakopcic, with additional bespoke modifications assessed. These models, typically formulated as coupled algebraic-differential equations integrating electrical quantities (voltage and current) with internal state variables governing device dynamics, were optimized using two robust approaches: (1) interior-point optimization with gradient-based search, and (2) Nelder-Mead gradient-free optimization, both with box constraints applied. A thorough comparison and discussion of the optimized model parameters ensued, accompanied by an examination of sensitivity to diverse frequency and amplitude ranges. The findings inform conclusions and provide a foundation for future refinements, underscoring the importance of multi-model evaluation and advanced optimization strategies in precise memristor modeling. The presented methodology offers a valuable framework for elucidating optimal modeling paradigms tailored to specific memristor architectures and operating regimes, ultimately enhancing their integration in emerging neuromorphic and computational applications.