Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
July 5, 2024Journal of Micro/Nanopatterning Materials and Metrology

Denoising model for scanning electron microscope images of integrated circuits based on denoising diffusion probabilistic models

View Full Paper
Ask AI
Bookmark
Share

Authors

XWXiao WeiNanchang UniversityFZFazhan ZhaoChinese Academy of SciencesHMHongtu MaShenyang Aerospace University

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Wei et al. (2024) studied this question.

synapsesocial.com/papers/68e614b6b6db6435875a77e2https://doi.org/10.1117/1.jmm.23.3.034201
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Image Denoising by Sparse 3-D Transform-Domain Collaborative Filtering2007 · 9,405 citations
  2. 2NAFSSR: Stereo Image Super-Resolution Using NAFNet2022 · 166 citations
  3. 3A New False Data Injection Attack Detection Model for Cyberattack Resilient Energy Forecasting2022 · 81 citations
  4. 4Suppression of noise in SEM images using weighted local hysteresis smoothing filter2016 · 15 citations