Modification of tube-based X-ray fluorescence spectrometer with an Am-241 excitation-based attachment for rare-earth elements analysis

This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer's utility. Successful identification and quantification of Scandium (8.1 ± 1.3 mg), Ytterium (7.9 ± 2.0 mg), Lanthanum (27.5 ± 2.1 mg), Cerium (60.4 ± 2.5 mg), Neodymium (29.7 ± 1.2 mg), Samarium (4.6 ± 2.0 mg), Europium (0.8 ± 0.4 mg), Gadolinium (2.6 ± 0.6 mg), and Erbium (3.5 ± 1.2 mg) were achieved using their K-X-rays. The quantitative analysis employed the "Elemental Sensitivities Method" and was validated against established methods like Instrumental Neutron Activation Analysis (INAA) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS). The modified system demonstrated an accuracy of approximately 80% in analyzing REEs in the IAEA-Soil 7 reference material.