In this paper, the mechanism of Dark‐Spot defect in thin film transistor liquid crystal display (TFT‐LCD) and its improvement measures are studied. The Dark‐Spot defect has a strong correlation with Polymer Film on Array (PFA) materials through stress analysis, and the defect can be reduced by a series of improvement we provided from PFA process adjusting and material formula optimizing.
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Li et al. (2024) studied this question.
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