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The measurement of resistivity in a compressed material within a diamond anvil cell presents significant challenges. The high-pressure experimental setup makes it difficult to directly measure the size changes induced by pressure in the three crystallographic directions of the sample. In this study, we introduce a novel and effective method that addresses these technical challenges. This method is anticipated to offer a valuable foundation for high-pressure investigations on quantum materials, particularly those with anisotropic layered structures.
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Sun et al. (2024) studied this question.
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