Quantifying the effect of X-ray scattering for data generation in real-time defect detection

X-ray imaging is widely used for the non-destructive detection of defects in industrial products on a conveyor belt. In-line detection requires highly accurate, robust, and fast algorithms. Deep Convolutional Neural Networks (DCNNs) satisfy these requirements when a large amount of labeled data is available. To overcome the challenge of collecting these data, different methods of X-ray image generation are considered.