A Universal Auto Configured Efuse Solution on ADVANTEST V93000 ATE Platform

eFuse is widely applied in disposable programmable memory in chip, written into specific data before delivery from factory. With the device scale and complexity increased rapidly, a universal and reliable eFuse solution becomes so important that helps avoid fatal failure. Typical test program usually burns used bit into '1' and keeps unused bit with '0'. For those normal system on chip devices, a common and universal configured eFuse solution is necessary for those family devices. Based on these requirements, this paper introduces the relevant analysis, framework design and result implemented on ADVANTEST V93000 ATE platform.