Epitaxially grown Ge-on-Si(111) based vertical type light-emitting diodes (LEDs) including a single strained SiGe layer or strained SiGe/Ge multiple quantum wells (MQWs) as intrinsic active layers are fabricated and their electroluminescence (EL) properties are compared. It is found from their diode characteristics that off-leakage currents are highly suppressed by the strained SiGe insertion, and resultantly, markedly enhanced room-temperature EL emission is obtained for the SiGe/Ge MQWs LED compared to LED with only Ge active layer, indicating that the strained SiGe/Ge heterostructures are promising toward high efficiency light source in the Si photonics.
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Kikuoka et al. (2024) studied this question.
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