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A novel true random number generator (TRNG) approach is presented using the state-of-the-art SNGCT selectors as a randomness source. Thanks to the selector back-end-of-line compatibility, the randomness source can be integrated directly in nonvolatile memory arrays to reduce cell area and improve security. A record-high 7 Mbps bitrate is demonstrated at both 30 °C and 125 °C. The randomness is validated through the standard NIST SP800-22 assessment. A complete assessment of the limits of the current implementation is done. With further circuit integration, beyond 100 Mbps at 0.3 pJ/bits is expected with the capability of 1014 bits per selector.
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Guy et al. (2024) studied this question.
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