Fluorescence microscopy through scattering layers by a virtual reflection-matrix

Optical-resolution fluorescence imaging in complex samples is challenging due to random light scattering, with significant implications across multiple fields. Here, we adapt computational reflection-matrix techniques developed for scattering compensation in phase-sensitive coherent imaging, to incoherent fluorescence imaging that solely relies on intensity detection. Moreover, we numerically and experimentally demonstrate that the adoption of random illuminations can substantially decrease the number of measurements necessary for effective reflection-matrix solutions.