Here we summarize the technological requirements and challenges on the road towards an automotive capable embedded 22FDX ® STT-MRAM solution. Especially achieving readability across an extended temperature range and the more stringent chip failure rate criteria require significant advancements from the first generation of consumer/industrial grade eMRAM. The impact of MTJ diameter and simple stack engineering on read margin will be discussed. Furthermore, the automotive readiness of 22FDX ® STT-MRAM will be demonstrated.
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Müller et al. (2024) studied this question.
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