Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
February 26, 2024IEEE Electron Device LettersOpen Access

Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

View Full Paper
Ask AI
Bookmark
Share

Authors

PSP. Sarazá-CanflancaIMECFFFerenc FodorIMECJDJ. Diaz-FortunyIMEC

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Sarazá-Canflanca et al. (2024) studied this question.

synapsesocial.com/papers/68e779e4b6db6435876ee620https://doi.org/10.1109/led.2024.3369860
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Theory of Breakdown Position Determination by Voltage- and Current-Ratio Methods2008 · 33 citations
  2. 2Physical Unclonable Functions and Applications: A Tutorial2014 · 1,368 citations
  3. 3A PUF scheme using competing oxide rupture with bit error rate approaching zero2018 · 85 citations
  4. 4Dielectric breakdown induced epitaxy in ultrathin gate oxide - a reliability concern2003 · 34 citations