Analog-to-Digital Converters continue to push the limits in terms of sampling rate, bandwidth, and aperture.Session 22 showcases a diverse assortment of enabling techniques and approaches: continuous-time pipeline, time-to-digital converter, high-speed channels, massive interleaving, efficient input networks, and background calibrations.The first paper presents an ADC for direct RF sampling, while the second contribution aims for high-performance instrumentation and communication applications.In the third paper, a 40GS/s ADC is presented for wireline applications, followed by a wideband ADC incorporating background calibration techniques.The final paper showcases the fastest ADC of the session, also targeting wireline communication.
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