This prototype achieves 1.17 mV vertical resolution and effective number of bits in photoelectric detection systems.
This paper presents a 200 MS/s analog-to-digital converter (ADC) based on a multi-chain merged time-to-digital converter architecture, implemented in a Xilinx Artix-7 FPGA. The calibrated system achieves 1.17 mV vertical resolution across a 0.05–2.35 V input range and 7.1 effective number of bits at 1.13 MHz. The developed ADC further demonstrates single-photoelectron (SPE) detection capability when interfaced with a photomultiplier tube, and maintains linear response up to 30 PEs. These results suggest potential applications of FPGA-ADC technology in photoelectrical detection systems as an alternative to conventional commercial ADC chips.
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He et al. (2025) studied this question.
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