Experimental findings showed a 73% extinction ratio improvement in electric field imaging, highlighting potential for advanced millimeter-wave applications.
In this paper, we demonstrated a high-sensitivity polarization image sensor for millimeter-wave electric field imaging using electro-optic crystals. We developed a three-layer on-pixel polarizer structure fabricated with a 0.35-µm standard CMOS process, achieving an extinction ratio of 5.7, which corresponds to a 73% improvement over previous two-layer structure. Crosstalk reduction was implemented by applying a bias voltage to the n-well pixel separation, and extinction ratio was further improved. By using an improved sensor, it demonstrated a 7.6 dB SNR improvement in 30 GHz electric field imaging compared to previous sensors, despite 30% transmittance reduction. Angular dependence analysis confirmed adequate performance within the optical system’s constraints. These results enable high-speed and high-sensitivity millimeter-wave imaging applications.
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Okada et al. (2025) studied this question.
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