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October 18, 2025Microscopy and Microanalysis

Sequential Tilting 4D-STEM for Improved Momentum-Resolved STEM Field Mapping

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Authors

CFChristoph FlathmannURUlrich RoßJBJürgen Belz

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Overview

This method enhances momentum-resolved scanning transmission electron microscopy and improves field resolution, indicating refined measurement strategies.

Key Points

  • The approach enhances measurements of magnetic and electric fields at nanometer scales with improved precision.
  • By recording diffraction patterns for each beam tilt, this method enhances data analysis beyond simple averaging.
  • This concept allows for the creation of virtual convergent beam electron diffraction patterns to evaluate data quality.
  • The technique can be applied broadly to various 4D-STEM applications, indicating its versatility and significance.

Cite This Study

Flathmann et al. (2025) studied this question.

synapsesocial.com/papers/68f35bfc73f0a7d050f47d32https://doi.org/10.1093/mam/ozaf086
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