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November 12, 2025Microscopy and MicroanalysisOpen Access

Multi-angle Precession Electron Diffraction (MAPED): A Versatile Approach to 4D-STEM Precession

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Authors

SRStephanie M. RibetRDRohan DhallCOColin Ophus

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Overview

Demonstrates improved strain and orientation measurement in various microscopes, indicating flexible experimental setup.

Key Points

  • The study aims to enhance accuracy in strain, orientation, and phase mapping using a new electron diffraction method.
  • Introduced multi-angle precession electron diffraction (MAPED) technique.
  • Conducted sequential 4D-STEM scans at different incident beam tilts.
  • Averaged multiple diffraction datasets to minimize Ewald sphere impact.
  • Four additional tilts enhanced measurement accuracy compared to single-tilt 4D-STEM.
  • Data collection was successful across various microscopes and detectors.
  • Improved material property measurement was achieved.

Cite This Study

Ribet et al. (2025) studied this question.

synapsesocial.com/papers/69252e83c0ce034ddc3559fchttps://doi.org/10.1093/mam/ozaf103
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