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December 12, 2025Molecules3 citationsOpen Access

In2O3: An Oxide Semiconductor for Thin-Film Transistors, a Short Review

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CAChristophe AvisJJJin Jang

Key Points

  • The review aims to summarize the properties and advancements in In2O3 thin-film transistors (TFTs).
  • Assessment of material properties and carrier concentration effects
  • Evaluation of charge neutrality level (CNL) position
  • Description of TFT stability parameters and stress tests
  • Introduction of fabrication processes like spin-coating
  • Discussion on device engineering and integration in applications.
  • In2O3 TFTs have achieved mobilities exceeding 100 cm2/Vs.
  • The review highlights the influence of doping on optical properties and carrier concentration.
  • Recent advancements showcased applications of In2O3 TFTs in neuromorphic computing.

Abstract

With the discovery of amorphous oxide semiconductors, a new era of electronics opened. Indium gallium zinc oxide (IGZO) overcame the problems of amorphous and poly-silicon by reaching mobilities of ~10 cm2/Vs and demonstrating thin-film transistors (TFTs) are easy to manufacture on transparent and flexible substrates. However, mobilities over 30 cm2/Vs have been difficult to reach and other materials have been introduced. Recently, polycrystalline In2O3 has demonstrated breakthroughs in the field. In2O3 TFTs have attracted attention because of their high mobility of over 100 cm2/Vs, which has been achieved multiple times, and because of their use in scaled devices with channel lengths down to 10 nm for high integration in back-end-of-the-line (BEOL) applications and others. The present review focuses first on the material properties with the understanding of the bandgap value, the importance of the position of the charge neutrality level (CNL), the doping effect of various atoms (Zr, Ge, Mo, Ti, Sn, or H) on the carrier concentration, the optical properties, the effective mass, and the mobility. We introduce the effects of the non-parabolicity of the conduction band and how to assess them. We also introduce ways to evaluate the CNL position (usually at ~EC + 0.4 eV). Then, we describe TFTs’ general properties and parameters, like the field effect mobility, the subthreshold swing, the measurements necessary to assess the TFT stability through positive and negative bias temperature stress, and the negative bias illumination stress (NBIS), to finally introduce In2O3 TFTs. Then, we will introduce vacuum and non-vacuum processes like spin-coating and liquid metal printing. We will introduce the various dopants and their applications, from mobility and crystal size improvements with H to NBIS improvements with lanthanides. We will also discuss the importance of device engineering, introducing how to choose the passivation layer, the source and drain, the gate insulator, the substrate, but also the possibility of advanced engineering by introducing the use of dual gate and 2 DEG devices on the mobility improvement. Finally, we will introduce the recent breakthroughs where In2O3 TFTs are integrated in neuromorphic applications and 3D integration.

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Cite This Study

Avis et al. (2025) studied this question.

synapsesocial.com/papers/6940190c2d562116f28f64cbhttps://doi.org/10.3390/molecules30244762
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