YOLO-AEB: PCB Surface Defect Detection Based on Adaptive Multi-Branch Attention and Efficient Atrous Spatial Pyramid Pooling

The surface defect detection of printed circuit boards (PCBs) plays a crucial role in the field of industrial manufacturing. However, the existing PCB defect detection methods have great challenges in detecting the accuracy of tiny defects under the complex background due to its compact layout. To address this problem, we propose a novel YOLO-AMBA-EASPP-BiFPN (YOLO-AEB) network based on the YOLOv10 framework that achieves high precision and real-time detection of tiny defects through multi-level architecture optimization. In the backbone network, an adaptive multi-branch attention mechanism (AMBA) is first proposed, which employs an adaptive reweighting algorithm (ARA) to dynamically optimize fusion weights within the multi-branch attention mechanism (MBA), thereby optimizing the ability to represent tiny defects under complex background noise. Then, an efficient atrous spatial pyramid pooling (EASPP) is constructed, which fuses AMBA and atrous spatial pyramid pooling-fast (ASPF). This integration effectively mitigates feature degradation while preserving expansive receptive fields, and the extraction of defect detail features is strengthened. In the neck network, the bidirectional feature pyramid network (BiFPN) is used to replace the conventional path aggregation network (PAN), and the bidirectional cross-scale feature fusion mechanism is used to improve the transfer ability of shallow detail features to deep networks. Comprehensive experimental evaluations demonstrate that our proposed network achieves state-of-the-art performance, whose F1 score can reach 95.7% and mean average precision (mAP) can reach 97%, representing respective improvements of 7.1% and 5.8% over the baseline YOLOv10 model. Feature visualization analysis further verifies the effectiveness and feasibility of YOLO-AEB.