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December 1, 2025Surface Science Spectra

Superconducting platinum silicide analyzed by x-ray photoelectron spectroscopy

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Authors

JNJames P. NovakTHTianhao HuTNTharanga Nanayakkara

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Overview

Analysis reveals characteristics of a superconducting PtSi film, suggesting it has minimal native silicon oxide.

Key Points

  • Superconducting platinum silicide was characterized using x-ray photoelectron spectroscopy.
  • Core level spectra including Pt and Si were assessed for reference data.
  • Assessment used Al Kα excitation source to understand material properties.
  • Findings highlight potential applications in silicon technology and superconducting materials.

Cite This Study

Novak et al. (2025) studied this question.

synapsesocial.com/papers/69402a652d562116f290198bhttps://doi.org/10.1116/6.0005008
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