We report on the performance of a secondary electron monitor (SEM) grid for determining the transverse profile of an MeV range electron beam tested at SLAC National Accelerator Laboratory’s NLCTA facility. When inserted into the path of the electron beam, secondary electron emission results in a measurable current on the wires that make up the grid. We present measurements using this technique to reconstruct the beam profile. The SEM grid was designed and built by a team of Harvey Mudd College (HMC) undergraduate students and tested at SLAC’s NLCTA facility in collaboration with NCLTA staff as part of the BeamNetUS program. This SEM grid, developed for real-time measurements of an MeV scale electron beam, could have applications in industry and medicine.
Baxter et al. (Thu,) studied this question.