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February 5, 2026Electricity0 citationsOpen Access

Investigation of Transients Generated by Dry-Contact Switching of LED Lamps

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AAAlisson L. AgustiGLGiane G. LenziJBJose M. Balthazar

Key Points

  • The study aims to explore how switching transients affect the performance and durability of LED lamps.
  • Measured voltage behavior in LED lamps during switching using an oscilloscope.
  • Conducted tests on various LED lamps and one incandescent lamp in a 220 VRMS/60 Hz electrical network.
  • Performed automated acquisition of waveform records for analysis.
  • Measured transient voltage peaks reaching 391 V on the supply side and 370 V on the lamp side.
  • Identified voltage slew rates, with peaks of 19.5 V/µs at the lamp side, exceeding standard parameters.
  • Obtained a total of 56 waveform records and 2920 captured screens for analysis.

Abstract

LED lamps have not been demonstrating the durability claimed by their manufacturers. One hypothesis is that switching transients may contribute to this. This study investigated switching-induced transients in LED lamps operated through dry contacts: manual switches and contactors. Using an oscilloscope, automated acquisition of waveform records was performed while several lamps were switched on in a 220 VRMS/60 Hz electrical network. LED lamps of different models and manufacturers, one incandescent lamp, and a group of 48 LED lamps, subdivided into six sets of eight lamps, were all switched simultaneously. A total of 56 waveform-record files were obtained from the oscilloscope, comprising 2920 captured screens and 170 measurements. Transient voltage peaks of 380 and 391 V at the supply side, and 357 and 370 V at the lamp side, as well as voltage slew rates of up to 12 and 13 V/µs at the supply side and up to 16 and 19.5 V/µs at the lamp side, were measured, without considering statistical variations, which may indicate values exceeding the ordinary sinusoidal voltage peak (≅311 V) and its typical worst-case slew rate (≅0.12 V/µs). Future studies are suggested, such as tests in real installations, investigations of transient amplification or attenuation within electrical networks, assessment of the effects of wiring and impedance discontinuities, switch bounce, and semiconductor degradation, among others, to continue these studies.

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Cite This Study

Agusti et al. (2026) studied this question.

synapsesocial.com/papers/698435c9f1d9ada3c1fb4fc2https://doi.org/10.3390/electricity7010013
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