Metrological framework and modulation-frequency optimization for robust near-field electromagnetic characterization via pulsed light fluorescence thermography

Key Points

• The aim is to establish a metrological framework for effective near-field electromagnetic characterization.
• Developed a modulation-frequency optimization strategy
• Utilized pulsed light fluorescence thermography for measurements
• Performed various tests to validate the framework
• Achieved high accuracy in electromagnetic characterization
• Enhanced measurement robustness under varying conditions
• Established guidelines for practical applications in the field