Effect of Ni–Sn electrode on insulation resistance degradation in BaTiO3-based multi-layer ceramic capacitors

As the BaTiO3 dielectric layer of multi-layer ceramic capacitors becomes thinner, the problem of leakage current degradation arises. In this study, the relationship between the Sn content in Ni–Sn internal electrodes and reliability enhancement is clarified. In addition, based on high-resolution interfacial observations, changes in the work function of the Ni–Sn internal electrode are examined to investigate the mechanism of insulation degradation suppression. Determination of the work function is conducted using both analytical and computational approaches. From these results, the mechanism by which Sn addition to Ni internal electrodes suppresses insulation degradation is discussed.