Analyzes the structure of a-Si1-xCx:H alloys, revealing local bonding details in silicon and carbon atoms.
We present a study of the structure of a-Si1-xCx:H allois by wide-angle x-ray scattering. By carefully analyzing the radial distribution functions and comparing with previous extended x-ray-absorption fine structure measurements, we provide a detailed and quantitative description of local bonding around Si and C atoms. Among the results presented, most noteworthy are constant interatomic distances in first and second shells and the detection of a strong tendency for chemical order.
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F. et al. (1995) studied this question.
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