Key result
Induced heating in conductive metallic implants during MRI is associated with RF power propagation and loss corresponding to the B1+rms, which changes only with RF pulse sequences.
Induced heating in metallic implants during MRI is associated with RF power propagation and loss corresponding to the B1+rms, which varies based on pulse sequences, coils, and Tx/Rx combinations.
We describe the relationship between the RF-induced temperature change in a conductive metallic implant during the MRI, B1+rms, and RF power for RF pulse sequences, RF coils, and Tx/Rx combinations. We show that both temperature and RF power change with RF pulse sequences, RF coils, and Tx/Rx combinations, whereas B1+rms changes only with RF pulse sequences but not RF coils and Tx/Rx combinations. As a result, induced heating is associated with RF power propagation and loss corresponding to the B1+rms.
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Gültekin et al. (2026) conducted a letter in RF-induced heating near implanted conductive devices during MRI. RF pulse sequences, RF coils, and Tx/Rx combinations was evaluated on Relationship between RF-induced temperature change, B1+rms, and RF power. Induced heating in conductive metallic implants during MRI is associated with RF power propagation and loss corresponding to the B1+rms, which changes only with RF pulse sequences.
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