Analysis of correlation and path coefficient of yield and yield-related traits among the elite sorghum [Sorghum bicolor (L.)Moench] genotypes in dry lowland areas of Ethiopia

Sorghum [Sorghum bicolor ( L.) Moench ] is an important cereal crop widely grown in arid and semi-arid regions worldwide. Understanding the relationships between grain yield and its component traits is critical for the development of effective breeding programs. The study was conducted with elite sorghum genotypes at Miesso and Kobo using an alpha lattice design to examine the correlation between yield and its component traits. The analysis focused on estimating the direct and indirect contributions of these traits to grain yield using correlation and path coefficient analyses, thereby identifying the most yield-influencing characteristics among the genotypes. Based on the correlation analysis, grain yield showed significant negative associations with days to flowering, days to maturity, and leaf width. It exhibited a non-significant relationship with plant height, number of leaves per plant, and panicle width, while showing a positive and significant correlation with grain filling period, stand count at harvest, panicle length, and number of heads per plot. Also, the path coefficient analysis results show that the number of heads per plot, leaf area, panicle length, and grain filling period all had a direct positive effect on sorghum grain yield at both the phenotypic and genotypic levels, indicating that improving these traits will increase total grain yield. However, traits such as number of days to flowering, date of maturity, thousand seed weight, and leaf width had a negative direct effect on yield, while most other traits had negligible indirect effects. These results provide valuable guidance for targeted selection in sorghum breeding programs aiming to enhance grain yield.