Features of the Magneto-Optical Kerr Effect for Multilayer Ta(2 nm)/Co50Pt50(4.6 nm)/Ta(2 nm) Nanostructure

The spectral and field dependences of the transversal magnetooptical Kerr effect have been studied in a thin-film Ta(2 nm)/Co50Pt50(4.6 nm)/Ta(2 nm) nanostructure synthesized by magnetron sputtering on a silicon substrate. The parameters of the structural layers were estimated using X-ray reflectometry and diffraction. Field dependences of magnetization are typical of structures with magnetization in the plane. It is shown that the equatorial Kerr effect in the nanoscale structure reaches a value of 10–2 comparable to bulk cobalt. The calculation of the spectral dependences of the effect using the Berreman matrix method showed agreement with experimental data on the order of magnitude, but not on the shape of the spectrum, characterized by resonant behavior. The resonant behavior of magneto-optical spectra is associated with the influence of the quantum dimensional effect.