The spin Hall effect (SHE) of light is a useful metrological tool for characterizing the structure parameters' variations of nanostructure. In this letter, we propose using the SHE of light to identify the graphene layers. This technique is based on the mechanism that the transverse displacements in SHE of light are sensitive to the variations of graphene layer numbers.
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Zhou et al. (2012) studied this question.
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