What question did this study set out to answer?

The aim is to develop a new method for accurately calibrating lateral force in atomic force microscopy.

Lateral force microscopy calibration using an interferometric atomic force microscope

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Demonstrates a new calibration method for lateral force in atomic force microscopy, suggesting improved precision and ease of use.

The aim is to develop a new method for accurately calibrating lateral force in atomic force microscopy.
Introduced a combination of an interferometric detector and optical beam detector for measuring lateral force.
Implemented an automatic calibration protocol with minimal user input.
Validated probe tip height measurement against electron micrograph data.
Achieved a lateral force calibration consistent within 1.4 μm compared to electron micrograph validation.
Calibration method closely matched the wedge calibration method within its intrinsic uncertainty.
Demonstrated applicability for various cantilevers tested.

Lefever et al. (2026) studied this question.

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