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A unified model of hopping carrier injection and space-charge-limited current (SCLC) in disordered organic materials is formulated. It is shown that, contrary to what one would intuitively expect, a metal contact with the injection barrier as high as 1 eV can be still an Ohmic contact at low temperatures providing conditions for the hopping SCLC.
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Архипов et al. (2003) studied this question.
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