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A feasibility and performance study of electrically reconfigurable nanowire transistors with selectable pFET and nFET operations is presented. The challenges toward circuit implementation are evaluated based on transient simulations of logic circuits. A novel physical structure capable of computing a NAND as well as NOR function is introduced. The new approach provides a flexible platform to develop and test fine-grain reconfigurable circuits and systems.
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Trommer et al. (2014) studied this question.
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