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July 7, 2025Journal of Applied PhysicsOpen Access

Hafnium oxide-based ferroelectric field effect transistors: From materials and reliability to applications in storage-class memory and in-memory computing

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APAgniva PaulGKGautham KumarADApu Das

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Paul et al. (2025) studied this question.

synapsesocial.com/papers/6a07d0bdd80ff23c9d79fb7bhttps://doi.org/10.1063/5.0278057
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