Multiphonon Raman Spectrum of Silicon

The energy and polarization characteristics of the one- and two-phonon Raman spectrum have been measured using a 180^∘{} backscattering technique. The two-phonon spectrum was measured at 20, 80, and 305^∘{}K. The one-phonon spectrum was measured at 17, 30, 80, and 305 ^∘{}K. The one-phonon line of symmetry Γ₂₅, was shown to be Lorentzian and to have a deconvoluted half-width at 17 ^∘{}K of 1.45 ±{} 0.05 cm^-1. The two-phonon Raman spectrum was used to determine phonon energies at the four critical points Γ, X, L, and W.