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Thin evaporated films of CdS on glass were studied in the wavelength range 4000A to 7500A. Measurements of film thickness and reflectivity as a function of wavelength were used to determine the index of refraction and the extinction coefficient. Density measurements and aging tests were also carried out. The effects on film properties of a variation of the rate of deposition were investigated.
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Gottesman et al. (1954) studied this question.
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