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September 1, 1997Journal of the American Society for Mass Spectrometry

External accumulation of ions for enhanced electrospray ionization fourier transform ion cyclotron resonance mass spectrometry

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Authors

MSMichael W. SenkoThermo Fisher Scientific (United States)CHChristopher L. HendricksonFlorida State UniversityMEMark R. EmmettFlorida State University

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Senko et al. (1997) studied this question.

synapsesocial.com/papers/6a0dfa0bef77fbf977d6bcbfhttps://doi.org/10.1016/s1044-0305(97)00126-8
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