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October 1, 1991Journal of The Electrochemical Society133 citations

Photoreduction of Hexavalent Chromium during X‐Ray Photoelectron Spectroscopy Analysis of Electrochemical and Thermal Films

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GHGary P. HaladaCCClive R. Clayton

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Abstract

Cr spectra obtained by x-ray photoelectron spectroscopy (XPS) of corrosion product layers is critically examined for evidence of photoreduction of hexavalent species. Tetravatent and trivalent decomposition products are identified, and methods of curve fitting and analysis are discussed. Disagreement between x~ray absorption ear end structure and XPS data, and between thermodynamic analysis and XPS data lead to the acceptance of a model for photoreduction of Cr 6+ based primarily upon core photoemission. Chromium, as a major alloying element in corrosion re-sistant alloys, has been the subject of numerous analytical studies. The purpose of such studies has often been to de-termine the role Cr plays in the formation of oxidized spe-cies which may act as a surface barrier to further com-bined electrochemical or chemical reaction. The usefulness of x-ray photoelectron spectroscopy (XPS) in characterizing the top one to fifteen atomic layers has led many groups, including this laboratory, to use it as a

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Cite This Study

Halada et al. (1991) studied this question.

synapsesocial.com/papers/6a0e44852d2f13287578d0eehttps://doi.org/10.1149/1.2085340
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