Reflectance measurements, in situ, on freshly deposited thin lead films are carried out in the far uv. Optical constants and other useful functions such as ε₁, ε₂, -Im(ε^-1), -Im(ε+1)^-1 are deduced. The existence of volume and surface plasmons is demonstrated. The structure of ε₂ is attributed to interband transitions both at critical points and between parallel bands; for the latter there is reasonable agreement between the experimental data and Ashcroft's calculation.
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Lemonnier et al. (1973) studied this question.
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